Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.

Format:

Book

Author/Creator:

Breitenstein, Otwin., Author.

Warta, Wilhelm., Author.

Schubert, Martin C., Author.

Series:

Springer Series in Advanced Microelectronics, 1437-0387 ; 10

Language:

English

Subjects (All):

Lasers.

Photonics.

Materials science.

Microwaves.

Optical engineering.

Building materials.

Optics, Lasers, Photonics, Optical Devices.

Characterization and Evaluation of Materials.

Microwaves, RF and Optical Engineering.

Structural Materials.

Local Subjects:

Optics, Lasers, Photonics, Optical Devices.

Characterization and Evaluation of Materials.

Microwaves, RF and Optical Engineering.

Structural Materials.

Physical Description:

1 online resource (339 pages)

Edition:

3rd ed. 2018.

Place of Publication:

Cham : Springer International Publishing : Imprint: Springer, 2018.

Summary:

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

Contents:

Introduction

Physical and Technical Basics

Experimental Technique

Theory

Measurement Strategies

Typical Applications

Summary and Outlook. .

ISBN:

3-319-99825-0