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Spectroscopic Ellipsometry for Photovoltaics : Volume 1: Fundamental Principles and Solar Cell Characterization / edited by Hiroyuki Fujiwara, Robert W. Collins.
- Format:
- Book
- Series:
- Springer Series in Optical Sciences, 0342-4111 ; 212
- Language:
- English
- Subjects (All):
- Lasers.
- Photonics.
- Optical materials.
- Electronics--Materials.
- Electronics.
- Microwaves.
- Optical engineering.
- Renewable energy resources.
- Optics, Lasers, Photonics, Optical Devices.
- Optical and Electronic Materials.
- Microwaves, RF and Optical Engineering.
- Renewable and Green Energy.
- Local Subjects:
- Optics, Lasers, Photonics, Optical Devices.
- Optical and Electronic Materials.
- Microwaves, RF and Optical Engineering.
- Renewable and Green Energy.
- Physical Description:
- 1 online resource (XX, 594 p. 336 illus., 266 illus. in color.)
- Edition:
- 1st ed. 2018.
- Place of Publication:
- Cham : Springer International Publishing : Imprint: Springer, 2018.
- Summary:
- This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
- Contents:
- Introduction
- Part I: Fundamental Principles of Ellipsometry
- Measurement Technique of Ellipsometry
- Data Analysis
- Optical Properties of Semiconductors
- Dielectric Function Modeling
- Effect of Roughness on Ellipsometry Analysis
- Part II: Characterization of Materials and Structures
- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon
- Crystalline Silicon Solar Cells
- Amorphous/Crystalline Si Heterojunction Solar Cells
- Optical Properties of Cu(In,Ga)Se2
- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization
- Cu2ZnSn(S,Se)4 and Related Materials
- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics
- High Efficiency III-V Solar Cells
- Organic Solar Cells
- Organic-Inorganic Hybrid Perovskite Solar Cells
- Solar Cells with Photonic and Plasmonic Structures
- Transparent Conductive Oxide Materials
- High-Mobility Transparent Conductive Oxide Layers.
- ISBN:
- 3-319-75377-0
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