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The Source/Drain Engineering of Nanoscale Germanium-based MOS Devices / by Zhiqiang Li.

SpringerLink Books Physics and Astronomy eBooks 2016 Available online

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Format:
Book
Author/Creator:
Li, Zhiqiang, Author.
Series:
Springer Theses, Recognizing Outstanding Ph.D. Research, 2190-5053
Language:
English
Subjects (All):
Semiconductors.
Electronic circuits.
Nanoscience.
Nanostructures.
Solid state physics.
Electronic Circuits and Devices.
Nanoscale Science and Technology.
Solid State Physics.
Local Subjects:
Semiconductors.
Electronic Circuits and Devices.
Nanoscale Science and Technology.
Solid State Physics.
Physical Description:
1 online resource (71 p.)
Edition:
1st ed. 2016.
Place of Publication:
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2016.
Language Note:
English
Summary:
This book mainly focuses on reducing the high parasitic resistance in the source/drain of germanium nMOSFET. With adopting of the Implantation After Germanide (IAG) technique, P and Sb co-implantation technique and Multiple Implantation and Multiple Annealing (MIMA) technique, the electron Schottky barrier height of NiGe/Ge contact is modulated to 0.1eV, the thermal stability of NiGe is improved to 600℃ and the contact resistivity of metal/n-Ge contact is drastically reduced to 3.8×10−7Ω•cm2, respectively. Besides, a reduced source/drain parasitic resistance is demonstrated in the fabricated Ge nMOSFET. Readers will find useful information about the source/drain engineering technique for high-performance CMOS devices at future technology node.
Contents:
Introduction
Ge-based Schottky barrier height modulation technology
Metal germanide technology
Contact resistance of Ge-based devices
Conclusions.
Notes:
Description based upon print version of record.
Includes bibliographical references.
ISBN:
3-662-49683-6

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