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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings : Antwerp, Belgium, USA, 17-19 April 2023 / Design, Automation, and Test in Europe Conference and Exhibition.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Conference Name:
Design, Automation, and Test in Europe Conference and Exhibition, author.
Language:
English
Subjects (All):
Electronic systems--Design and construction--Congresses.
Electronic systems.
Electronic industries--Automation--Congresses.
Electronic industries.
Physical Description:
1 online resource (1611 pages) : illustrations
Other Title:
2023 Design, Automation & Test in Europe Conference & Exhibition
Place of Publication:
Piscataway, NJ : IEEE, 2023.
Summary:
The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems This includes both hardware and embedded software design issues The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems Companies also present innovative industrial designs to foster the feedback from realworld design to research DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot topic sessions, tutorials and workshops.
Notes:
Description based on publisher supplied metadata and other sources.

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