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2023 IEEE 41st VLSI Test Symposium (VTS) : VTS 2023 : April 24th-26th, 2023, San Diego, CA, USA : proceedings / IEEE VLSI Test Symposium, Peilin Song, Mehdi Tahoori, Marcello Traiola.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Song, Peilin, author.
Tahoori, Mehdi, author.
Traiola, Marcello, author.
Conference Name:
IEEE VLSI Test Symposium, author.
Language:
English
Subjects (All):
Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated circuits.
Physical Description:
1 online resource : illustrations
Other Title:
2023 IEEE 41st VLSI Test Symposium
Place of Publication:
Piscataway, NJ : IEEE, 2023.
Summary:
The Premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems, the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing field of VLSI Test.
Notes:
Description based on publisher supplied metadata and other sources.
Includes index.
ISBN:
9798350346305

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