CMOS image sensors / Konstantin D. Stefanov.

Format:

Book

Author/Creator:

Stefanov, Konstantin D., author.

Contributor:

Institute of Physics (Great Britain), publisher.

Series:

IOP (Series). Release 22.

IOP ebooks. 2022 collection.

[IOP release $release]

IOP ebooks. [2022 collection]

Language:

English

Subjects (All):

Metal oxide semiconductors, Complementary.

Image processing--Digital techniques.

Image processing.

Physical Description:

1 online resource (various pagings) : illustrations (some color).

Place of Publication:

Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]

System Details:

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Biography/History:

Dr. Konstantin Stefanov is a Senior Research Fellow at the Centre for Electronic Imaging at The Open University, UK, and has over 20 years of experience in the field of CMOS and CCD image sensors, including characterisation, simulations, and design.

Summary:

This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.

Contents:

1. The fundamentals

1.1. Introduction

what is an image sensor and what does it do?

1.2. Charge generation

1.3. Charge collection

1.4. Charge transfer

1.5. Charge conversion

1.6. pn junction

1.7. MOS capacitor

1.8. MOS transistor

1.9. Source follower

2. CMOS pixel architectures

2.1. History and technology

2.2. Photodiode APS

2.3. Pinned photodiode (4T)

2.4. Other PPD-based pixels

2.5. Hybrid and 3D image sensors

3. Advanced image sensor topics

3.1. Photocurrent

3.2. Dark current

3.3. Reflective barrier

3.4. Back-side illumination

3.5. Depletion depth and potential gradients

3.6. Punch-through

3.7. Field-induced junctions

4. Noise and readout techniques

4.1. Noise in image sensors

4.2. Correlated double sampling

5. Characterisation

5.1. Introduction

5.2. Readout modes

5.3. Principles of EO characterisation

5.4. Photoresponse, non-uniformity and nonlinearity

5.5. Photon transfer curve

5.6. X-ray calibration

5.7. Full well capacity and dynamic range

5.8. Dark current and DSNU

5.9. Noise measurement

5.10. Image lag

5.11. Quantum efficiency

5.12. Electrical transfer function

6. Electronics

6.1. On-chip electronics

6.2. Off-chip electronics.

Notes:

"Version: 20221201"--Title page verso.

Includes bibliographical references.

Title from PDF title page (viewed on December 5, 2022).

Other Format:

Print version:

ISBN:

9780750332354

9780750332347

OCLC:

1353822961

Access Restriction:

Restricted for use by site license.