Theory and practice of thermal transient testing of electronic components [electronic resource] / Márta Rencz, Gábor Farkas, András Poppe, editors.

Format:

Book

Contributor:

Rencz, M. (Marta), editor.

Farkas, Gábor, editor.

Poppe, András, editor.

Language:

English

Subjects (All):

Electronic apparatus and appliances--Testing.

Electronic apparatus and appliances.

Physical Description:

1 online resource

Place of Publication:

Cham, Switzerland : Springer, [2022]

Summary:

This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices.

Contents:

Introduction: the Importance and Motivation

Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature

The Use of Thermal Transient Testing

General Practical Questions and the Flow of Thermal Transient Measurements

On the Accuracy and Repeatability of Thermal Measurements.

Notes:

Includes bibliographical references and index.

ISBN:

9783030861742

3030861740

OCLC:

1366058199

Access Restriction:

Restricted for use by site license.