Optical Metrology and Inspection for Industrial Applications VIII / edited by Sen Han, Gerd Ehret, Benyong Chen.

Format:

Book

Contributor:

Han, Sen, editor.

Ehret, Gerd, editor.

Chen, Benyong, editor.

Language:

English

Subjects (All):

Optical detectors--Industrial applications--Congresses.

Optical detectors.

Physical Description:

1 online resource (6 pages)

Place of Publication:

[Place of publication not identified] : SPIE, 2021.

Summary:

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Notes:

Description based on online resource; title from PDF title page (SPIE, viewed May 7, 2023).

ISBN:

1-5106-4648-5