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Optical and Quantum Sensing and Precision Metrology / Selim M. Shahriar, Jacob Scheuer, editors.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 11700.
- Proceedings of SPIE ; Volume 11700
- Language:
- English
- Subjects (All):
- Optical instruments--Congresses.
- Optical instruments.
- Metrology--Congresses.
- Metrology.
- Physical Description:
- 1 online resource (270 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2021.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-4236-6
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