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Second International Conference on Testing Technology and Automation Engineering (TTAE 2022) / edited by Yang Yue.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering.
- Proceedings of SPIE--the International Society for Optical Engineering
- Language:
- English
- Subjects (All):
- Artificial intelligence--Congresses.
- Artificial intelligence.
- Physical Description:
- 1 online resource.
- Other Title:
- Second International Conference on Testing Technology and Automation Engineering
- Place of Publication:
- [Place of publication not identified] : SPIE, 2022.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-6020-8
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