Optical Technology and Measurement for Industrial Applications Conference 2021. Volume 11927 / edited by Takeshi Hatsuzawa, Rainer Tutsch, Toru Yoshizawa.

Format:

Book

Contributor:

Yoshizawa, Toru, editor.

Tutsch, Rainer, editor.

Hatsuzawa, Takeshi, editor.

Language:

English

Subjects (All):

Technology--Congresses.

Technology.

Physical Description:

1 online resource (6 pages)

Place of Publication:

[Place of publication not identified] : SPIE, 2021.

Summary:

This PDF file contains the front matter associated with SPIE Proceedings Volume 11927, including the Title Page, Copyright information, and Table of Contents.

Contents:

Single pixel imaging and its applications Author(s): Kouichi Nitta

Ghost imaging with probability estimation using convolutional neural network: improving estimation accuracy using parallel convolutional neural network Author(s): Shoma Kataoka; Yasuhiro Mizutani; Tsutomu Uenohara; Yasuhiro Takaya

Time of flight three-dimensional imaging camera using temporal compressive sampling technique Author(s): Quang Duc Pham; Yoshio Hayasaki

On the possibility of visualization of relief of rough surfaces via laser induced thermal emission Author(s): Kateryna Zelenska; Olga Tkach; Serge Zelensky; Olexandr Kolesnik; Toru Aoki

Preparation of luminescent Si nanocrystals from rice husks Author(s): Kimihisa Matsumoto; So Ito; Kazuhide Kamiya; Mitsuru Inada; Hidehiro Yasuda

Simulation study on diameter measurement technique for submicrometer-sized tapered fibers with standing wave illumination Author(s): Sojiro Murakami; Shotaro Kadoya; Satoru Takahashi

Shape control using hologram-assisted talbot lithography Author(s): Naoki Ura; Yasuhiro Mizutani; Ryu Ezaki; Tsutomu Uenohara; Yoshihiko Makiura; Yasuhiro Takaya

Hologram optimized in holographic laser processing system Author(s): Honghao Zhang; Satoshi Hasegawa; Haruyoshi Toyoda; Yoshio Hayasaki

3D profile measurement of openings with optical caliper Author(s): Lianhua Jin; Takuma Ashizawa; Toru Yoshizawa

Modeling the dynamic optical gain in a 3D printed waveguide due to polymer swelling Author(s): Kunal Sharma; Waleed S. Mohammed; Tanujjal Bora

Single-step fabrication of microfiber long period grating structure through a modulated arc discharge process Author(s): Pedram Hosseini; Mohammad Javad Khodarahmi; Mohmmad Kazemzadeh; Hamidreza Karimi-Alavijeh

Noise floor comparison of optical displacement measuring interferometer between air and vacuum environments Author(s): Masato Aketagawa; Kousuke Sakasai; Masato Higuchi; Dong Wei; Thanh Dong Nguyen

Radius measurement of large aperture long-focal-length lens using computer-generated hologram Author(s): Jian-Peng Cui; Zhi-Gang Li; Zhen-Jun Bao; Heng Zhao; Ning Zhang; Jie Liu; Di-Long Wu; Hua Xu; Ping Ma

Out-of-plane displacement measurement using laser parallel fringes generated in camera with diffraction grating Author(s): Wei Jiang; Takuya Hara; Motoharu Fujigaki

Optically smooth and optically rough surfaces in 3D profilometry Author(s): Pavel Pavlicek

Mid-infrared (LWIR) Hyperspectral camera for on-site analysis Author(s): Ichiro Ishimaru

Fringe projection method for 3D shape measurement using linear LED device and cylindrical lens array Author(s): Motoharu Fujigaki; Takuya Hara

The FDTD analysis for diffraction limited microgroove structure with standing wave illumination for the realization of coherent structured illumination microscopy Author(s): Yizhao Guan; Masahiro Kume; Shotaro Kadoya; Masaki Michihata; Satoru Takahashi

Resolution evaluation of displacement measuring interferometer with sinusoidal phase modulation and modified phase-locked loop Author(s): Masato Aketagawa; Masato Higuchi; Tomohiro Sowa; Dong Wei; Masato Aketagawa

Fourier demodulation approach for a rotating polarizer analyzer polarimeter for retardance measurements Author(s): David Ignacio Serrano Garcia; Francisco Joel Cervantes Lozano; Geliztle Alejandra Parra Escamilla; Jorge L. Flores Nuñez; Guillermo Garcia Torales

Large scale thin film thickness uniformity extraction based on dynamic spectroscopic ellipsometry Author(s): Daesuk Kim; Gukhyeon Hwang; Gukhyeon Hwang; Sukhyun Choi; Vamara Dembele; Saeid Kheiryzadehkhanghah; Inho Choi; Chung Song Kim; Daesuk Kim

Spectroscopic polarization measurement and control using channeled spectrum Author(s): Kazuhiko Oka; Keisaku Yamane; Moritsugu Sakamoto; Ryuji Morita

Ellipsometric characterizations of individual nanoform structures Author(s): Tim Kaeseberg; Jana Grundmann; Sven Teichert; Matthias Wurm; Thomas Siefke; Stefanie Kroker; Bernd Bodermann

Optical and anisotropic stress properties of flexible (Ta2O5/SiO2)2 antireflection film deposited by E-gun evaporation with ion-beam assisted deposition Author(s): Kun-Hong Chen; Hsi-Chao Chen; Sheng-Bin Chen; Guan Yu Chen; Tsung Tse Wu; Kuo Chou Kai

Calibration of the astigmatism errors induced by misalignment of quadri-wave lateral shearing interferometer Author(s): Yiwei Si; Ke Liu; Yanqiu Li; Peng Qin; Hui Zhong

Quality map guided parallel phase unwrapping algorithm for multi-lateral shearing interferometry Author(s): Liang Wang; Ke Liu; Yanqiu Li

Fast calibration for Star test polarimetry via polarization orthogonal basis mapping Author(s): Tianlei Ning; Guodong Zhou; Jiazhi Wang; Yanqiu Li.

Notes:

Description based on online resource; title from PDF title page (SPIE, viewed March 29, 2023).

ISBN:

1-5106-4723-6