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2022 IEEE 31st Asian Test Symposium : ATS 2022 : Taichung, Taiwan 21-23 November 2022 : proceedings / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (163 pages) : illustrations
- Place of Publication:
- Los Alamitos, California : IEEE, 2022.
- Contents:
- Reliable Designs
- Secure Scan Chain
- Measurement and Calibration for Test
- Aging Reliability
- Diagnostic and On-line Tests
- System Security and Trust
- Advanced Test Generation Methods
- Machine Learning and Test AI
- Error Analysis and Tolerance
- Author Index.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes index.
- ISBN:
- 1665472278
- 9781665472272
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