Chapter 71-Electronics / SW. Dean, R. Baboian.

Format:

Book

Author/Creator:

Dean, SW., author.

Baboian, R., author.

Contributor:

American Society for Testing and Materials

ASTM International.

Series:

Journal of ASTM International. Manual Series ; MNL11077M.

ASTM manual series ; MNL11077M

Language:

English

Subjects (All):

Microelectromechanical systems.

Microtechnology.

Physical Description:

1 online resource (8 pages) : illustrations, figures, tables.

Volume 2005, Issue 20 (January 2005)

Other Title:

ASTM digital library.

Place of Publication:

West Conshohocken, Pa. : ASTM International, 2005.

System Details:

Mode of access: World Wide Web.

text file PDF

Summary:

FAILURE IN ELECTRONICS DUE TO corrosion has become a significant factor because of the extremely complex systems (microchips, integrated circuits, computers, et cetera) that have been developed and the increasing demand on their reliability. Electronics are now a part of all industries, ranging from transportation industries to medical and consumer products. Technological advances have resulted in the development of sophisticated components with closer spacing so that extremely low levels of corrosive contaminants can cause failure. Testing for this type of behavior is difficult and costly. Further advances in electronics can only be made where corrosion issues are addressed and reliability is maintained. Many publications have appeared in the technical literature on the subject of corrosion in electronics with more and more emphasis on testing [1-10].

Notes:

"ASTM Stock Number: MNL11077M".

Includes bibliographical references 36.

Electronic reproduction. W. Conshohocken, Pa. : ASTM International, 2005. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.

Description based on publisher's website, viewed May 03, 2017.

ISBN:

9780803145559 (e-ISBN)

9780803120983

0803120982

Access Restriction:

Restricted for use by site license.