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DFT : 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 8-10 October 2018, Chicago, IL, USA / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Conference/Event
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author.
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (2018 : Chicago, Ill.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits.
- Nanotechnology--Congresses.
- Nanotechnology.
- Physical Description:
- 1 online resource (980 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2019.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore, viewed April 24, 2020).
- ISBN:
- 1-5386-8398-9
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