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2017 International Conference on Software Analysis, Testing and Evolution (SATE) / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, issuing body, author.
Language:
English
Subjects (All):
Computer software--Development--Congresses.
Computer software.
Physical Description:
1 online resource (92 pages) : illustrations
Other Title:
2017 International Conference on Software Analysis, Testing and Evolution
Place of Publication:
Piscataway, New Jersey : IEEE, 2017.
Summary:
The conference focuses on Software Analysis, Software Testing and Evolution It provides a premier forum for software engineering researchers, professional software analysts, testers and developers to present research findings, share practical experience and exchange academic ideas.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
1-5386-3687-5

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