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VTS 2018 : 2018 IEEE 36th VLSI Test Symposium : proceedings : April 22nd - 25th 2018, San Francisco, California (USA) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Conference/Event
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author.
- Conference Name:
- IEEE VLSI Test Symposium (36th : 2018 : San Francisco, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (619 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2018.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed April 15, 2020).
- ISBN:
- 1-5386-3774-X
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