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2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / IEEE Electron Devices Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures (2018 : Austin, Tex.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Physical Description:
- 1 online resource (78 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2018.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed April 28, 2020).
- ISBN:
- 1-5386-5071-1
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