IEEE Std 1804-2017 : IEEE Standard for Fault Accounting and Coverage Reporting (FACR) for Digital Modules / Institute of Electrical and Electronics Engineers.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Fault location (Engineering).

Physical Description:

1 online resource (29 pages)

Other Title:

1804-2017 - IEEE Standard for Fault Accounting and Coverage Reporting

IEEE Std 1804-2017

Place of Publication:

New York : IEEE, [2018]

Summary:

Aspects of fault models as they are relevant to the generation of test patterns for digital circuits are formalized in this standard. Fault counting, fault classification, and fault coverage reporting across different automatic test pattern generation (ATPG) tools, for the single stuck-at fault model are included in the scope. It shall be incumbent for fault coverage to be reported in a uniform way on all ATPG tools (that comply with this standard). The generation of a uniform coverage (and, hence, a uniform test quality) metric for large chips [including systems-on-chips (SOCs)] with different cores and modules for which test patterns have been independently generated will be facilitated by this standard.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-5044-4317-9