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IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) : IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Digital electronics--Standards.
- Digital electronics.
- Standards, Engineering.
- Physical Description:
- 1 online resource (747 pages)
- Other Title:
- 1671.3-2017 - IEEE Standard for Automatic Test Markup Language
- IEEE Std 1671.3-2017
- Place of Publication:
- New York, New York : IEEE, 2018.
- Summary:
- An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5044-4567-8
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