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2018 IEEE International Test Conference : 29 October-1 November 2018, Phoenix, AZ, USA / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Test Conference (2018 : Phoenix, Ariz.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Computer software--Testing--Congresses.
- Computer software.
- Physical Description:
- 1 online resource (72 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2018.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed April 23, 2020).
- ISBN:
- 1-5386-8382-2
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