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2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Nanotechnology--Congresses.
- Nanotechnology.
- Physical Description:
- 1 online resource
- Other Title:
- 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Place of Publication:
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, 2017.
- Summary:
- DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9781538603628
- 1538603624
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