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2017 IEEE International Test Conference (ITC) / Institute of Electrical and Electronics Engineers Staff.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers (IEEE), author, issuing body.
- Language:
- English
- Subjects (All):
- Radio frequency--Congresses.
- Radio frequency.
- Semiconductors--Testing.
- Semiconductors.
- Computer software--Testing--Congresses.
- Computer software.
- Physical Description:
- 1 online resource (485 pages) : illustrations
- Other Title:
- 2017 IEEE International Test Conference
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
- Summary:
- International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5386-3413-9
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