1 option
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / IEEE.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing.
- Integrated circuits.
- Embedded computer systems--Testing.
- Embedded computer systems.
- Systems on a chip--Testing--Standards.
- Systems on a chip.
- Physical Description:
- 1 online resource (168 pages)
- Place of Publication:
- New York : IEEE, 2022.
- Summary:
- A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5044-8866-0
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.