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2022 IEEE Workshop on Design Automation for CPS and IoT (DESTION) / IEEE Workshop on Design Automation for CPS and IoT, Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Contributor:
Institute of Electrical and Electronics Engineers, author, issuing body.
Conference Name:
IEEE Workshop on Design Automation for CPS and IoT, author.
Language:
English
Subjects (All):
Automation--Congresses.
Automation.
Physical Description:
1 online resource (71 pages) : illustrations
Other Title:
2022 IEEE Workshop on Design Automation for CPS and IoT
Place of Publication:
Piscataway : IEEE, 2022.
Summary:
The conference focuses on research of an empirical nature pertaining to systems, architecture and applications for time sensitive or embedded systems It also includes on fundamental models, techniques, methods, and analyses that are applicable to time sensitive systems to solve specific problems.
Contents:
Surrogates for Computationally Expensive and Failure-Prone Simulators,"
A Flight Dynamics Model for Exploring the Distributed Electrical eVTOL Cyber Physical Design Space,"
Design Oracle for AI-Based CPS Design,"
Integrating Multiple HLA Federations for Effective Simulation-Based Evaluations of CPS,"
Rapid Design Space Exploration with Constraint Programming,"
Combinatorial and Parametric Gradient-Free Optimization for Cyber-Physical System Design,"
Trinity AI Co-Designer for Hierarchical Oracle-guided Design of Cyber-Physical Systems,"
A learning-based framework for generating 3D building models from 2D images,"
Developing a Testing Framework for Cyber-Physical Systems using Gazebo,"
Repeatable & Scalable Multi-Vehicle Simulation with Offloaded Dynamics using Federated Modeling,"
Comparing Strategies for Visualizing the High-Dimensional Exploration Behavior of CPS Design Agents,".
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
1-66547-040-2

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