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2022 IEEE 40th VLSI Test Symposium (VTS) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2022 IEEE 40th VLSI Test Symposium
- Place of Publication:
- Piscataway, New Jersey : IEEE, 2022.
- Summary:
- The premier IEEE Symposium will bring together scientists, academics, and practicing engineers from all over the world to explore emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems the aim of this conference is to provide an international forum for these experts to promote, share, and discuss various issues and developments in the growing field of VLSI Test.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9781665410601
- 1665410604
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