Coupled Multiscale Simulation and Optimization in Nanoelectronics / edited by Michael Günther.

Format:

Book

Contributor:

Günther, Michael., Editor.

Series:

The European Consortium for Mathematics in Industry, 2946-1871 ; 21

Language:

English

Subjects (All):

Mathematics--Data processing.

Mathematics.

Microtechnology.

Microelectromechanical systems.

Engineering mathematics.

Engineering--Data processing.

Engineering.

Nanoscience.

Computational Science and Engineering.

Microsystems and MEMS.

Mathematical and Computational Engineering Applications.

Nanophysics.

Local Subjects:

Computational Science and Engineering.

Microsystems and MEMS.

Mathematical and Computational Engineering Applications.

Nanophysics.

Physical Description:

1 online resource (574 p.)

Edition:

1st ed. 2015.

Place of Publication:

Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.

Language Note:

English

Summary:

Designing complex integrated circuits relies heavily on mathematical methods and calls for suitable simulation and optimization tools. The current design approach involves simulations and optimizations in different physical domains (device, circuit, thermal, electromagnetic) and in a range of electrical engineering disciplines (logic, timing, power, crosstalk, signal integrity, system functionality). COMSON was a Marie Curie Research Training Network created to meet these new scientific and training challenges by (a) developing new descriptive models that take these mutual dependencies into account, (b) combining these models with existing circuit descriptions in new simulation strategies, and (c) developing new optimization techniques that will accommodate new designs. The book presents the main project results in the fields of PDAE modeling and simulation, model order reduction techniques and optimization, based on merging the know-how of three major European semiconductor companies with the combined expertise of university groups specialized in developing suitable mathematical models, numerical schemes and e-learning facilities. In addition, a common Demonstrator Platform for testing mathematical methods and approaches was created to assess whether they are capable of addressing the industry’s problems, and to educate young researchers by providing hands-on experience with state-of-the-art problems. .

Contents:

Part I Introduction: 1 The COMSON Project: Michael Günther and Uwe Feldmann

Part II Partial Differential Algebraic Equations: 2 PDAE Modeling and Discretization: Giuseppe Alì, Massimiliano Culpo, Roland Pulch, Vittorio Romano and Sebastian Schöps

3 Simulation of Coupled PDAEs - Dynamic Iteration and Multirate Simulation: Giuseppe Alì, Andreas Bartel, Michael Günther, Vittorio Romano and Sebastian Schöps

Part III Model Order Reduction: 4 Model Order Reduction - Methods, Concepts and Properties: Athanasios C. Antoulas, Roxana Ionutiu, Nelson Martins, E. Jan W. ter Maten, Kasra Mohaghegh, Roland Pulch, Joost Rommes, Maryam Saadvandi and Michael Striebel

5 Parameterized Model Order Reduction: Gabriela Ciuprina, Jorge Fernández Villena, Daniel Ioan, Zoran Ilievski, Sebastian Kula, E. Jan W. ter Maten, Kasra Mohaghegh, Roland Pulch, Wil H.A. Schilders, L. Miguel Silveira, Alexandra ¸ Stefánescu and Michael Striebel

6 Advanced topics in Model Order Reduction: Davit Harutyunyan, Roxana Ionutiu, E. Jan W. ter Maten, Joost Rommes, Wil H.A. Schilders and Michael Striebel

Part IV Optimization: 7 Optimization Methods and Applications to microelectronics CAD: Salvatore Rinaudo, Valeria Cinnera Martino, Franco Fiorante, Giovanni Stracquadanio and Giuseppe Nicosia

Part V COMSON Methodology: 8 COMSON Demonstrator Platform: Georg Denk, Tamara Bechtold, Massimiliano Culpo, Carlo de Falco and Alexander Rusakov

9 eLearning in Industrial Mathematics with applications to Nano electronics: Giuseppe Alì, Eleonora Bilotta, Lorella Gabriele, Pietro Pantano, José Sepúlveda, Rocco Servidio, and Alexander Vasenev

Index.

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

3-662-46672-4