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An in situ study of resistance degradation and switching of bulk yttria-stabilized zirconia and strontium titanate single crystals / Ana Alvarez.

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Format:
Book
Thesis/Dissertation
Author/Creator:
Alvarez, Ana María (Editor), author.
Contributor:
Chen, I-Wei, degree supervisor.
University of Pennsylvania. Department of Materials Science and Engineering, degree granting institution.
Language:
English
Subjects (All):
Engineering.
Materials science.
Materials science and engineering--Penn dissertations.
Penn dissertations--Materials science and engineering.
Local Subjects:
Engineering.
Materials science.
Materials science and engineering--Penn dissertations.
Penn dissertations--Materials science and engineering.
Physical Description:
1 online resource (354 pages)
Contained In:
Dissertations Abstracts International 83-08B.
Place of Publication:
[Philadelphia, Pennsylvania] : University of Pennsylvania ; Ann Arbor : ProQuest Dissertations & Theses, 2021.
Language Note:
English
System Details:
Mode of access: World Wide Web.
Summary:
Understanding resistance changes under a constant or set of bipolar-switching voltage(s) is important for thin-film devices, specifically multilayer capacitors and resistance-switching memory. However, identifying critical locations of changes and failures in thin films is difficult, so this work studies the same phenomena in single crystals of yttria-stabilized zirconia (YSZ) and iron-doped strontium titanate (STO) starting with highly accelerated lifetime tests (HALT) at higher temperatures. Although doped STO is a p-type semiconductor and YSZ a fast oxygen-ion conductor with little electronic conductivity, their DC resistance-degradation curves are remarkably indistinguishable. Yet different mechanisms were revealed by in-situ hot-stage photography and thermal imaging in two test environments-air and silicone oil. In YSZ, DC (electro)reduction does not appreciably alter oxygen stoichiometry; nevertheless, above a threshold voltage, it can raise the chemical potential of electrons to the conduction-band level, thereby triggering a metal-insulator (resistance) transition. In contrast, DC-stressed STO undergoes oxygen-vacancy demixing, forming a p-n junction with elevated electronic conductivity, albeit late-stage-demixing can be so sluggish that the steady state is difficult to reach in low-temperature HALT. In both oxides, an inherent instability in the governing field equation dictates degradation follows filament-like paths, which explains the strong field dependence and large variation of lifetimes. Upon further voltage reversals, degraded crystals exhibit different, large resistance changes. In YSZ, a change in DC voltage can already cause a resistance change, which is unipolar switching. But additional resistance degradation after voltage reversal can facilitate filament fragmentation, thus rendering the crystal bipolarly switchable due to a voltage-sensitive metal-insulator transition in a thin layer of barely metallic YSZ adjacent to the original anode. In STO, voltage reversals broaden/narrow a nanolayer of stoichiometric, ionic STO (called i-region) that straddles the p-n junction, by driving electromigration to act in-concert/against back-diffusion of oxygen ions. Thickening/thinning of such region leads to resistance increase/decrease, resulting in the so-called "eightwise" bipolar switching. (Interface-controlled, "counter-eightwise" switching was also observed in more severely degraded STO.) As these phenomena find analogies in thin-film devices, mechanisms revealed above have provided new insight that will help understand and improve the performance and reliability of engineering devices.
Notes:
Source: Dissertations Abstracts International, Volume: 83-08, Section: B.
Advisors: Chen, I-Wei; Committee members: Davies, Peter K.; Feng, Liang; Gorte, Raymond J.
Department: Materials Science and Engineering.
Ph.D. University of Pennsylvania 2021.
Local Notes:
School code: 0175
ISBN:
9798780658207
Access Restriction:
Restricted for use by site license.
This item must not be sold to any third party vendors.

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