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Atomic Force Microscopy : Imaging, Measuring and Manipulating Surfaces at the Atomic Scale / edited by Victor Bellitto.
- Format:
- Book
- Author/Creator:
- Bellitto, Victor, Editor.
- Language:
- English
- Subjects (All):
- Spectrum analysis.
- Mass spectrometry.
- Physical Description:
- 1 online resource (270 pages)
- Other Title:
- Atomic force microscopy
- Place of Publication:
- IntechOpen 2012
- [Place of publication not identified] : IntechOpen, 2012.
- Language Note:
- English
- Summary:
- With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
- Notes:
- Description based on: online resource; title from PDF information screen (InTech, viewed October 20, 2022).
- Includes bibliographical references and index.
- ISBN:
- 9789535149873
- 9535149873
- Access Restriction:
- Open access Unrestricted online access
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