X-ray spectroscopy / edited by Shatendra K Sharma.

Format:

Book

Author/Creator:

Sharma, Shatendra K., Editor.

Contributor:

Sharma, Shatendra K., editor.

Language:

English

Subjects (All):

X-ray spectroscopy.

Physical Description:

1 online resource (292 pages) : illustrations

Place of Publication:

IntechOpen 2012

[Place of publication not identified] : InTech, [2012]

Language Note:

English

Summary:

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

Notes:

Description based on: online resource; title from PDF information screen (InTech, viewed October 14, 2022).

Includes bibliographical references.

ISBN:

9789535149460

9535149466