Synchrotron radiation : sources and applications to the structural and electronic properties of materials / D. Phil Woodruff, University of Warwick.

Format:

Book

Author/Creator:

Woodruff, D. P., author.

Language:

English

Subjects (All):

Synchrotron radiation.

Physical Description:

1 online resource (xi, 284 pages) : digital, PDF file(s).

Edition:

1st ed.

Place of Publication:

Cambridge : Cambridge University Press, 2021.

Summary:

Learn about the properties of synchrotron radiation and its wide range of applications in physics, materials science and chemistry with this invaluable reference. This thorough text describes the physical principles of the subject, its source and methods of delivery to the sample, as well as the different techniques that use synchrotron radiation to analyse the electronic properties and structure of crystalline and non-crystalline materials and surfaces. Explains applications to study the structure and electronic properties of materials on a microscopic, nanoscopic and atomic scale. An excellent resource for current and future users of these facilities, showing how the available techniques can complement information obtained in users' home laboratories. Perfect for graduate and senior undergraduate students taking specialist courses in synchrotron radiation, in addition to new and established researchers in the field.

Contents:

Cover

Half-title

Title page

Copyright information

Contents

Preface

List of Abbreviations and Acronyms

1 Introduction

1.1 New Lamps for Old . . .

1.2 Particle Accelerators: A Brief Historical Introduction

1.3 Synchrotron Radiation Basics

2 Synchrotron Radiation Sources

2.1 A Brief History

2.2 Electron Storage Rings

2.3 Insertion Devices: Wigglers and Undulators

2.3.1 Wavelength Shifters and Multipole Wigglers

2.3.2 Undulators

2.3.3 Sources of Variable Polarisation

2.4 Electron Bunches, Time Structure, Lifetimes

2.5 Emittance and Spectral Brightness

2.6 Practical Constraints: What Determines the Source Characteristics?

2.7 Coherence

2.8 Free Electron Lasers

2.9 The Energy Recovery Linac

2.10 'Compact' Sources

3 Getting the Light to the Sample: Beamlines

3.1 Introduction

3.2 Mirrors

3.3 Focusing Lenses

3.4 Monochromators: From Visible to Soft X-Rays

3.5 X-Ray Monochromators

3.6 Incident Beam Flux Monitors

4 Crystalline Structural Techniques

4.1 X-Ray Diffraction Basics

4.2 X-Ray Diffraction Detectors

4.3 X-Ray Diffraction Structure Determination

4.4 Standard X-Ray Diffraction Methods

4.5 Surface X-Ray Diffraction (SXRD)

4.6 X-Ray Standing Waves (XSW)

4.6.1 XSW Principles

4.6.2 XSW Structure Determination, Triangulation and Imaging

5 Local Structural Techniques

5.1 Introduction

5.2 X-Ray Scattering from Non-Crystalline Samples: General Considerations

5.3 Determining Atomic Pair Distribution Functions from X-Ray Scattering

5.4 SAXS (Small Angle X-Ray Scattering)

5.5 Photoelectron Scattering Techniques: Basic Principles

5.6 X-Ray Absorption Fine Structure (XAFS)

5.6.1 EXAFS

5.6.2 Near-Edge Absorption Fine Structure

5.7 Photoelectron Diffraction

5.8 X-Ray Fluorescence Holography (XFH).

6 Probes of Electronic Structure

6.1 Photoemission

6.1.1 Core Level Photoemission

6.1.2 Valence State Photoemission and ARPES (Angle-Resolved Photoelectron Spectroscopy)

6.1.3 HAXPES (Hard X-Ray Photoelectron Spectroscopy)

6.2 X-Ray Absorption and Magnetic Circular Dichroism

6.3 X-Ray Emission and Inelastic X-Ray Scattering

6.3.1 XES and RIXS - X-Ray Emission Spectroscopy and Resonant Inelastic X-Ray Scattering

6.3.2 Compton Scattering

6.4 Photoemission and Photoionisation Studies of Gas-Phase Atoms and Molecules

7 Probes of Vibrational Structure

7.1 Introduction

7.2 Infrared Spectroscopy and Microspectroscopy

7.3 IXS: (High-Resolution) Inelastic X-Ray Scattering

8 Imaging and Micro/Nano-Analysis

8.1 Introduction

8.2 Incident Beam Focusing

8.3 Transmission Microscopy and Tomography

8.4 Spectroscopic Imaging

8.4.1 X-Ray Fluorescence

8.4.2 X-Ray Absorption Edge Spectroscopy and Photoemission

8.5 X-Ray Diffraction Topography

8.6 Coherent X-Ray Diffraction Imaging

References

Index.

Notes:

Title from publisher's bibliographic system (viewed on 27 Sep 2021).

ISBN:

1-108-10043-0

1-108-10323-5

1-316-99574-7

OCLC:

1285168263