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Proceedings of the 12th ACM SIGPLAN International Workshop on Virtual Machines and Intermediate Languages / editors, Marc Feeley, Juan Fumero.

ACM Digital Library Available online

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Format:
Book
Contributor:
Feeley, Marc, editor.
Fumero, Juan, editor.
Series:
ACM Conferences
Language:
English
Subjects (All):
Virtual computer systems--Congresses.
Virtual computer systems.
Programming languages (Electronic computers)--Congresses.
Programming languages (Electronic computers).
Computer software--Development--Congresses.
Computer software.
Physical Description:
1 online resource (14 pages) : illustrations.
Other Title:
VMIL 2020
Place of Publication:
New York : Association for Computing Machinery, 2020.
Summary:
Welcome to the 12th ACM Workshop on Virtual Machines and Language Implementations (VMIL'20). The workshop is co-located with SPLASH'20 in Chicago, US. The workshop aims at advancing the state of the art on the design and implementation of programming systems, with virtual machines - broadly defined - as a focus. Due to COVID-19, many computing conferences, including VMIL, have struggled to obtain submissions. The workshop had two submission deadlines. The first deadline was intended for mature work to be published as part of these proceedings. The second deadline was intended for work-in-progress papers, new ideas, and emerging results. In total, the workshop attracted one full-length paper and no work-in-progress submissions. Due to the low number of submissions, the submitted paper received eight reviews. The program committee accepted this submission for publication and presentation in the workshop. Additionally, this year we have four invited talks from industry and academia. Matthew Flatt on Racket's intermediate language for control. Mark Stoodley on JitBuilder2.0, a new framework for optimizing DLS compilers. Chris Seaton on new tools to help understanding the Graal IR, and finally, Vyacheslav Egorov on the evolution of the Dart programming language. We would like to thank the authors for their submission, and all program committee members for their high-quality and insightful reviews. Finally, we thank all attendees for their participation.
Notes:
Description based on publisher supplied metadata and other sources.

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