Principles of materials characterization and metrology / Kannan M. Krishnan.

Format:

Book

Author/Creator:

Krishnan, Kannan M., author.

Language:

English

Subjects (All):

Materials--Analysis.

Materials.

Physical Description:

1 online resource (869 pages)

Place of Publication:

Oxford, England : Oxford University Press, [2021]

Summary:

This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

Contents:

1. Introduction to Materials Characterization, Analysis, and Metrology

2. Atomic Structure and Spectra

3. Bonding and Spectra of Molecules and Solids

4. Crystallography and Diffraction

5. Probes : Sources and Their Interactions with Matter

6. Optics, Optical Methods, and Microscopy

7. X-Ray Diffraction

8. Diffraction of Electrons and Neutrons

9. Transmission and Analytical Electron Microscopy

10. Scanning Electron Microscopy

11. Scanning Probe Microscopy

12. Summary Tables.

Notes:

Description based on print version record.

ISBN:

1-5231-4126-3

0-19-186866-3

0-19-256608-3

OCLC:

1249475324