The VNA applications handbook / .Gregory Bonaguide, Neil Jarvis.

Format:

Book

Author/Creator:

Bonaguide, Gregory, author.

Jarvis, Neil, author.

Series:

Artech House microwave library.

Artech House microwave library

Language:

English

Subjects (All):

Phase modulation.

Physical Description:

1 online resource (391 pages)

Distribution:

[Piscataqay, New Jersey] : IEEE Xplore, [2019]

Place of Publication:

Norwood, Massachusetts : Artech House, [2019]

Summary:

Written by prominent experts in the field, this authoritative new resource provides guidelines for performing a wide variety of Vector Network Analyzers (VNA) measurements. The capabilities and limitations of modern VNA in the context of challenging real-world applications are explained, as well as insights for optimizing test setups and instrument settings, making accurate measurements and, equally important, avoiding costly mistakes.Organized by topic, the readers can focus on chapters covering particular measurement challenges. Application topics include linear and non-linear measurements of passive and active devices, frequency converting devices, and special considerations for high-power, high-gain, and pulsed devices. Signal Integrity and time-domain reflectometry are covered, as well as emerging applications at millimeter-wave frequencies driven by 5G and automotive radar. Waveguide is presented, with emphasis on understanding guided-wave propagation and the associated calculations required for creating calibration standards. Each application is supported by illustrations that help explain key concepts and VNA screenshots are used to show both expected and, in some cases, unexpected results. This book equips engineers and lab technicians to better understand these important instruments, and effectively use them to develop the technologies that drive our world.

Contents:

The VNA Applications Handbook; Contents; Preface; 1 Architecture of the Modern Vector Network Analyzer; 1.1 What Is a Vector Network Analyzer?; 1.2 Wave Quantities and S-Parameters; 1.2.1 One-Port Measurements; 1.2.2 Two-Port Measurements; 1.3 Architecture of an N-Port Network Analyzer; 1.3.1 Main Blocks; 1.3.2 Errors; 1.3.3 Test Set Challenges; 1.4 Swept Versus Stepped Mode; 1.4.1 Chopped Versus Alternate Mode; 2 Calibration; 2.1 VNA Measurements in an Ideal World; 2.2 Measurement Errors in the Real World; 2.2.1 Random Errors; 2.2.2 Systematic Errors; 2.3 Calibration Standards

2.3.1 Open (O)2.3.2 Short (S); 2.3.3 Match (M); 2.3.4 Sliding Match (Sliding Load); 2.3.5 Thru (T); 2.3.6 Reflect (R); 2.3.7 Line (L); 2.3.8 Symmetrical Network (N); 2.3.9 Attenuator Standard (A); 2.3.10 Unknown Thru (U); 2.4 Calibration Techniques; 2.4.1 Normalization; 2.4.2 Full Single-Port Correction (OSM); 2.4.3 One-Path, Two-Port Correction; 2.4.4 Seven-Term Error Correction; 2.4.5 12-Term Error Correction; 2.5 Power Calibration; 2.5.1 Source Power Calibration; 2.5.2 Receiver Power Cal; 2.5.3 SMARTerCal; 2.5.4 Automatic Level Control (ALC); References; Selected Bibliography

3 Passive and Active One-Port Device Measurements3.1 Passive One-Port Devices; 3.1.1 Steps for Setting Up a Single-Port Measurement; 3.1.2 Calibration for Multiple Single-Port Devices; 3.1.3 Port Configuration for Multiple Simultaneous Single-Port Measurements; 3.2 Impedance Measurements; 3.2.1 Impedance Traces; 3.2.2 Impedance Markers; 3.3 Phase and Electrical Length Measurements; 3.3.1 Calibration Offset Method; 3.3.2 Group Delay Method; 3.4 Measurement Uncertainty for Passive One-Port Devices; 3.4.1 Directivity; 3.4.2 Source Match

3.5 Active One-Port DUTs: Oscillators, VCOs, and Signal Generators3.5.1 Spurious Signals; 3.5.2 Heterodyne Images; 3.5.3 Receiver Compression/Overload; Reference; Selected Bibliography; Appendix 3A: Phase Wrap Resulting from an Offset Open or Offset Short Calibration Kit Standard; Appendix 3A.2: MATLAB Script for Generating Data for Offset Open and Short Standards Versus Frequency; 4 Passive Two-Port Device Measurements; 4.1 Passive Two-Port Devices; 4.1.1 Steps for Establishing a Two-Port Measurement Baseline; 4.1.2 Cable Measurements; 4.1.3 Filter Measurements

4.1.4 Passive Multiport Devices Measured as a Two-Port4.1.5 Switches: Time-Domain Transient Measurements; 4.1.6 Phase and Delay-Matching of Complex-Modulated Signals; Selected Bibliography; 5 Active Two-Port Device Measurements; 5.1 General-Purpose Amplifier Measurements; 5.1.1 Linear Measurements; 5.1.2 Nonlinear Measurements; 5.2 High-Power Amplifier Measurements; 5.2.1 Power Considerations for High-Power Calibration; 5.2.2 Power Calibration for High-Power Applications; 5.2.3 Adding an Attenuator to a Low-Power Sensor for High-Power Measurements; 5.2.4 Hot S22 Measurements

Notes:

Includes bibliographical references and index

Description based on print version record.

ISBN:

1-63081-602-7