X-ray phase-contrast imaging using near-field speckles / Marie-Christine Zdora.

Format:

Book

Author/Creator:

Zdora, Marie-Christine, author.

Series:

Springer theses 2190-5053

Springer Theses, Recognizing Outstanding Ph.D. Research, 2190-5053

Language:

English

Subjects (All):

Phase contrast magnetic resonance imaging.

Physics.

Physics, general.

Local Subjects:

Physics, general.

Genre:

Electronic books.

Physical Description:

1 online resource (xxi, 337 pages, 102 illustrations, 88 illustrations in color).

Edition:

First edition 2021.

Place of Publication:

Cham, Switzerland : Springer, [2021]

System Details:

text file PDF

Summary:

This thesis presents research on novel X-ray imaging methods that improve the study of specimens with small density differences, revealing their inner structure and density distribution. Exploiting the phase shift of X-rays in a material can significantly increase the image contrast compared to conventional absorption imaging. This thesis provides a practical guide to X-ray phase-contrast imaging with a strong focus on X-ray speckle-based imaging, the most recently developed phase-sensitive method. X-ray speckle-based imaging only requires a piece of abrasive paper in addition to the standard X-ray imaging setup. Its simplicity and robustness combined with the compatibility with laboratory X-ray sources, make it an ideal candidate for wide user uptake in a range of fields. An in-depth overview of the state of the art of X-ray speckle-based imaging and its latest developments is given in this thesis. It, furthermore, explores a broad range of applications, from X-ray optics characterisation, to biomedical imaging for 3D virtual histology and geological studies of volcanic rocks, demonstrating is promising potential. Moreover, the speckle-based technique is placed in the context of other phase-sensitive X-ray imaging methods to assist in the choice of a suitable method, hence serving as a guide and reference work for future users.

Contents:

Introduction

Principles of X-Ray Imaging

Synchrotron Beamlines, Instrumentation and Contributions

X-ray Single-Grating Interferometry

Principles and State of the Art Of X-Ray Speckle-Based Imaging

The Unified Modulated Pattern Analysis

At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis

3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis

Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging

Summary, Conclusions and Outlook

Appendices.

Notes:

Includes bibliographical references.

Description based on online resource; title from digital title page (viewed on May 18, 2021).

ISBN:

3030663299

9783030663292

OCLC:

1244120763

Access Restriction:

Restricted for use by site license.