Advances in optical surface texture metrology / edited by Richard Leach.

Format:

Book

Contributor:

Leach, R. K., editor.

Institute of Physics (Great Britain), publisher.

Series:

IOP series in emerging technologies in optics and photonics

IOP ebooks. 2020 collection.

IOP ebooks. [2020 collection]

Language:

English

Subjects (All):

Optical measurements.

Optical instruments.

Metrology.

Physical Description:

1 online resource (various pagings) : illustrations (some color).

Place of Publication:

Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2020]

System Details:

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

text file

Biography/History:

Professor Richard Leach currently holds the Chair in Metrology in the Faculty of Engineering at the University of Nottingham where he has established The Manufacturing Metrology Team to investigate information-rich metrology of surfaces, to support next-generation manufacturing technologies. Drawing on concepts such as machine learning and sensor fusion, his research is changing the approach to quality control in manufacturing. Prior to his current position, he spent 25 years at the National Physical Laboratory and led a team in surface and nanometrology. He is an internationally recognized researcher in the field of surface topography measurement, particularly in the area of traceability for areal surface metrology, including optical instruments. He has over 500 publications, including 8 textbooks. He is the European Editor-in-Chief for Precision Engineering journal. Richard is a visiting professor at Loughborough University and the Harbin Institute of Technology.

Summary:

Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.

Contents:

1. Terms and definitions / Richard Leach

2. Coherence scanning interferometry / Rong Su

3. Focus variation / Claudia Repitsch, Kerstin Zangl, Franz Helmli and Reinhard Danzl

4. Imaging confocal microscopy / Roger Artigas

5. Non-scanning techniques / Xiaobing Feng, Zhengchun Du and Jianguo Yang

6. Scattering approaches / Mingyu Liu

7. In-process surface topography measurements / Wahyudin P. Syam.

Notes:

"Version: 20201201"--Title page verso.

Includes bibliographical references.

Title from PDF title page (viewed on January 14, 2021).

Other Format:

Print version:

ISBN:

9780750325288

9780750325271

OCLC:

1231598969

Access Restriction:

Restricted for use by site license.