High-power radio frequency effects on electronic systems / D.V. Giri, Richard Hoad, Frank Sabath.

Format:

Book

Author/Creator:

Giri, D. V., author.

Hoad, Richard, author.

Sabath, Frank, author.

Contributor:

ProQuest ebook central.

Series:

Artech House electromagnetic analysis series

Artech House electromagnetics series

Language:

English

Subjects (All):

Electromagnetic compatibility.

Physical Description:

1 online resource.

polychrome

Place of Publication:

Norwood, MA : Artech House, [2020]

System Details:

text file

Contents:

High-Power Electromagnetic Effects on Electronic Systems

Contents

Foreword

Acknowledgments

1 Introduction

1.1 Reliance on Electronics

1.2 HPEM Environment Overview

1.3 HPEM Effects Overview

1.4 A Brief History of EM Interference and Effects

1.5 A Systems-of-Systems Hierarchy

1.5.1 Device

1.5.2 Circuit

1.5.3 Equipment

1.5.4 System

1.5.5 Network

1.5.6 Infrastructure

1.6 Summary

References

2 HPEM Environments

2.1 Introduction

2.2 Lightning

2.2.1 Overview

2.2.2 Lightning-Radiated Environment

2.3 Nuclear EM Pulse

2.3.1 HEMP-Radiated Environment

2.3.2 HEMP-Conducted Environment

2.3.3 Open-Source Accounts of HEMP Disturbances

2.3.4 HEMP Environment Summary

2.4 High-Power RF Directed Energy Environments

2.4.1 The Status of HPRF DE Systems Today

2.5 Intentional EM Interference Environments

2.5.1 IEMI Technical Capability Groups

2.5.2 IEMI Environment Summary

2.5.3 Open-Source Accounts of HPRF DE and IEMI Action

2.6 Classification of HPRF DE and IEMI Environments

2.6.1 Hypoband

2.6.2 Mesoband

2.6.3 Hyperband

2.7 Summary

3 HPEM Coupling and Interaction

3.1 EM Interaction Coupling Model

3.2 Topological Concept

3.3 Transfer Functions

3.3.1 Antenna Transfer Function

3.3.2 Free-Space Wave Propagation

3.3.3 Coupling/Radiation Efficiency

3.3.4 Diffusion Penetration

3.3.5 Aperture Penetration

3.3.6 Conducted Propagation

3.3.7 Galvanic, Capacitive, and Magnetic Coupling

3.3.8 Capacitive Coupling

3.3.9 Inductive Coupling

3.4 Field Variation Inside System Enclosure

3.5 Overall Response

3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure

3.5.2 Coupling as a Function of HPEM Environment Type

References

4 Overview of HPEM Test Facilities and Techniques

4.1 Introduction

4.1.1 General Considerations for the Scenario

4.1.2 General Considerations for HPEM Environment Simulation

4.1.3 General Considerations of the SUT

4.1.4 Summary

4.2 Uncertainty in Effects Testing

4.3 HPEM Effects Test Methods and Facilities

4.3.1 HPEM-Radiated Testing

4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation

4.3.3 Measuring the Radiated HPEM Environment

4.3.4 The Measurement Chain

4.3.5 HPEM Conducted Testing

4.3.6 Measuring the Conducted HPEM Environment

4.4 Exercising and Observing the SUT

4.5 Effects Data Presentation

4.6 Other Practical Considerations for HPEM Effects Testing

4.7 Summary

5 HPEM Effects Mechanisms

5.1 Introduction

5.2 Terminology

5.2.1 About This Chapter

5.3 Device and Circuit-Level Effects

5.3.1 Rectification

5.3.2 Noise

5.3.3 Interference or Jamming

5.3.4 Saturation

5.3.5 Shift in Operating Point

5.3.6 False Information

5.3.7 Transient Upset

5.3.8 Chaotic Effects

5.3.9 Damage and Destruction

5.3.10 Published Device and Circuit-Level Effects Data

Notes:

Electronic reproduction. Ann Arbor, MI Available via World Wide Web.

Description based on online resource; title from PDF title page (viewed on June 12, 2020)

Includes bibliographical references and index.

Other Format:

Print version: Giri, D. V. High-Power Electromagnetic Effects on Electronic Systems

ISBN:

9781630815899

1630815896

Publisher Number:

99987466543

Access Restriction:

Restricted for use by site license.