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A syllabus for the clinical examination of children : with the revised Binet-Simon scale for the measurement of intelligence / by Edmund B. Huey, A.M., Ph.D., lecturer on mental development in the Johns Hopkins University, assistant in psychiatry in the Phipps Clinic of the Johns Hopkins Hospital, author of The psychology and pedagogy of reading, backward and feeble-minded children.

Nineteenth Century Collections Online: Children's Literature and Childhood Available online

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Format:
Book
Author/Creator:
Huey, Edmund Burke, 1870-1913, author.
Series:
Nineteenth Century Collections Online: Children's Literature and Childhood.
Nineteenth Century Collections Online: Children's Literature and Childhood
Language:
English
Subjects (All):
Psychological tests for children.
Binet-Simon Test.
Physical Description:
1 online resource (45 pages) : illustrations.
Place of Publication:
Baltimore, Maryland : Warwick and York, [1912]
System Details:
text file
Notes:
Reproduction of the original from the Teachers College, Milbank Memorial Library, Columbia University.
Local Notes:
Scanned copy defective: pages 42 and 44 wanting.
OCLC:
644831252
Access Restriction:
Restricted for use by site license.

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