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2020 IEEE 29th Asian Test Symposium (ATS 2020) : proceedings : 22-25 November 2020, Malaysia / IEEE Asian Test Symposium.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Asian Test Symposium, author.
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Physical Description:
- 1 online resource (xl, 223 pages) : illustrations
- Other Title:
- 2020 IEEE 29th Asian Test Symposium
- Place of Publication:
- Piscataway, NJ : IEEE, 2020.
- Summary:
- Electronic test of devices, boards, and systems covering the complete test cycle from design verification,design for test, design for manufacturing, silicon debugging, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
- Contents:
- Technical Program
- About the 2020 IEEE 29th Asian Test Symposium
- Foreword
- ATS Steering Committee (2020-2022)
- Organizing Committee
- Program Committee
- Student Committee
- Welcome Message
- Keynotes
- Invited Talks
- Industry Forum
- Special Sessions
- Tutorials
- Sponsors
- ATS 2021 Call for Papers
- Track A1: DFT and Scan
- Track B1: Special Session on Hardware Security
- Track A2: Memory Test, Repair and Reliability
- Track B2: Industry Session
- Track A3: Reliability and Power Issues in Test
- Track A4: Fault Tolerance
- Track B4: Special Session on Robust Power Converter
- Track A5: Analog Test
- Track A6: 3D IC Test
- Track B6: Special Session on Analog and Mixed Signal Circuit
- Track A7: Security issues in Test and Debug
- Track B7: High Level Test/Verification
- Author Index.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes index.
- ISBN:
- 9781728174679
- 1728174678
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