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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / Institute of Electrical and Electronics Engineers (IEEE).
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Fault tolerance--Congresses.
- Integrated circuits.
- Nanotechnology--Congresses.
- Nanotechnology.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource : illustrations some color
- Other Title:
- 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
- Place of Publication:
- IEEE
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2020.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9781728194578
- 1728194571
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