Dependable embedded systems / editors, Jörg Henkel, Nikil Dutt.

Format:

Book

Author/Creator:

Henkel, J. (Jörg)

Contributor:

Henkel, J. (Jörg), Editor.

Dutt, Nikil, Editor.

Series:

Embedded systems (Springer (Firm)) 2193-0155

Language:

English

Subjects (All):

Electronic circuits.

Computer engineering.

Internet of things.

Embedded computer systems.

Microprocessors.

Physical Description:

1 online resource (XIII, 608 p. 293 illus., 250 illus. in color.)

Edition:

1st edition 2021.

Place of Publication:

Springer Nature 2021

Cham : Springer International Publishing : Imprint: Springer, 2021.

Language Note:

English

Summary:

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Contents:

Introduction

Design of efficient, dependable SoCs based on cross-layer-reliability approach with emphasis on wireless communication as application and DRAM memories

CRAU: Compositional System-Level Reliability Analysis in the Presence of Uncertainties

Semantics-aware Soft Error Handling for Embedded Systems using Compiler-OS Interaction

ARES: Self-Adaptive Coarse-Grained Reconfigurable Architectures as Reliability Enhancers in Embedded Systems

Cross-Layer Techniques for Dependable Software Execution on Embedded Systems

Ambrosia: Cross-layer Modeling and Mitigation of Aging Effects in Embedded Systems

Cross-Layer Dependability for Embedded Hardware/Software Systems

Fault-Tolerant Computing with Heterogeneous Hardware/Software Hardening Modes

Robust Computing for Machine Learning-Based Systems

Hardening embedded system software

LIFT: Lifting Device-Level Characteristics for Error Resilient System Level Design: A Crosslayer Approach

VirTherm-3D: Communication Virtualization Enabling System Management for Dependable 3D MPSoCs

OTERA: Online Test Strategies for Reliable Reconfigurable Architectures

Variability-Aware Software: Recent Results and Contributions

EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks

Lightweight Software-Assisted Memory Error Correction

Reliability-Driven Resource Management for Multi-Core Systems-on-Chip

Monitor Circuits for Device-Circuit Interaction

PERCIES: Providing Efficient Reliability in Critical Embedded Systems.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

3-030-52017-X

OCLC:

1231607877