My Account Log in

1 option

Measurement assurance for dimensional measurements on integrated-circuit photomasks / Carroll. Croarkin.

National Institute of Standards and Technology (NIST) Publications Available online

View online
Format:
Book
Government document
Author/Creator:
Croarkin, Carroll, author.
Contributor:
Croarkin, Carroll.
United States. National Bureau of Standards.
Series:
NBS technical note ; 1164.
NBS technical note ; 1164
Language:
English
Subjects (All):
Integrated circuits--Masks--Measurement.
Integrated circuits.
Optical instruments--Calibration.
Optical instruments.
Integrated circuits--Masks.
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982.
System Details:
text file
Notes:
1982.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
929066437
Publisher Number:
GOVPUB-C13-e093ca83ebd4bb2b49291a9a091832f6
Access Restriction:
Open Access Unrestricted online access

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account