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Sensitivity analysis for biometric systems : a methodology based on orthogonal experiment designs / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben.
- Format:
- Book
- Government document
- Author/Creator:
- Lee, Yooyoung, author.
- Series:
- NISTIR ; 7855.
- NISTIR ; 7855
- Language:
- English
- Genre:
- Technical reports.
- Physical Description:
- 1 online resource.
- Place of Publication:
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2012.
- System Details:
- text file
- Notes:
- 2012.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Includes bibliographical references.
- OCLC:
- 947049510
- Publisher Number:
- GOVPUB-C13-2ed63cb638cfc713ee2b875bf261ab62
- Access Restriction:
- Open Access Unrestricted online access
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