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Extending the notion of quality from physical metrology to information and sustainability / Gaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram.

National Institute of Standards and Technology (NIST) Publications Available online

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Format:
Book
Government document
Author/Creator:
Ameta, Gaurav, author.
Contributor:
Ameta, Gaurav.
Fenves, Steven J. (Steven Joseph)
Fiorentini, Xenia.
Lyons, Kevin W.
Mani, Mahesh.
Rachuri, Sudarsan.
Sriram, Ram D., 1957-
National Institute of Standards and Technology (U.S.)
Series:
NISTIR ; 7517.
NISTIR ; 7517
Language:
English
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.
System Details:
text file
Notes:
2008.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
947049559
Publisher Number:
GOVPUB-C13-20db8da4052c5d3e2059f0c9b6a6df1c
Access Restriction:
Open Access Unrestricted online access

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