My Account Log in

1 option

MEMS length and strain round robin results with uncertainty analysis / Janet C. Marshall; Robert I. Scace; Winthrop A. Baylies.

National Institute of Standards and Technology (NIST) Publications Available online

View online
Format:
Book
Government document
Author/Creator:
Marshall, J. C. (Janet C.), author.
Contributor:
Baylies, Winthrop A.
Marshall, J. C. (Janet C.)
Scace, Robet I.
National Institute of Standards and Technology (U.S.)
Series:
NISTIR ; 7291.
NISTIR ; 7291
Language:
English
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2006.
System Details:
text file
Notes:
2006.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
947048179
Publisher Number:
GOVPUB-C13-55523a274cb4e94094bcd6c084ea70e7
Access Restriction:
Open Access Unrestricted online access

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Library Catalog Using Articles+ Library Account