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Quality summarization : recommendations on biometric quality summarization across the application domain / Elham Tabassi; Patrick Grother.

National Institute of Standards and Technology (NIST) Publications Available online

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Format:
Book
Government document
Author/Creator:
Tabassi, Elham, author.
Contributor:
Grother, Patrick J.
Tabassi, Elham.
National Institute of Standards and Technology (U.S.)
Series:
NISTIR ; 7422.
NISTIR ; 7422
Language:
English
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2007.
System Details:
text file
Notes:
2007.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
947049480
Publisher Number:
GOVPUB-C13-dfc83694cdf152fce93f4f199e43dda8
Access Restriction:
Open Access Unrestricted online access

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