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Ellipsometry in the measurement of surfaces and thin films symposium proceedings.
- Format:
- Book
- Conference/Event
- Government document
- Conference Name:
- Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.)
- Series:
- United States. National Bureau of Standards. Miscellaneous publication ; 256.
- National Bureau of Standards miscellaneous publication ; 256
- National Bureau of Standards miscellaneous publication ; 256.
- Language:
- English
- Subjects (All):
- Polarization (Light).
- Surfaces (Technology).
- Thin films.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (vi, 359 pages) : illustrations.
- Place of Publication:
- Washington : U.S. National Bureau of Standards, 1964.
- System Details:
- text file
- Notes:
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
- Includes bibliographical references.
- Other Format:
- Print version: Symposium on the Ellipsometer and Its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.). Ellipsometry in the measurement of surfaces and thin films.
- OCLC:
- 885061001
- Publisher Number:
- GOVPUB-C13-ec27e7def6e3a080a94f6189dec5c769
- Access Restriction:
- Open Access Unrestricted online access
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