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RADC/NBS workshop moisture measurement and control for semiconductor devices, III : proceedings of the RADC/ NBS workshop held at the National Bureau of Standards Gaithersburg, MD November 2-4, 1983 / Benjamin A. Moore; Stanley Ruthberg.

National Institute of Standards and Technology (NIST) Publications Available online

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Format:
Book
Government document
Author/Creator:
Moore, Benjamin A., author.
Contributor:
Moore, Benjamin A.
Ruthberg, Stanley.
United States. National Bureau of Standards.
Series:
NBSIR ; 84-2852.
NBSIR ; 84-2852
Language:
English
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1984.
System Details:
text file
Notes:
1984.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
947843819
Publisher Number:
GOVPUB-C13-581e46f683ff51691c924891b61e54d4
Access Restriction:
Open Access Unrestricted online access

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