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An NMOS test chip for a course in semiconductor parameter measurements / K. P. Roenker; L. W. Linholm.
- Format:
- Book
- Government document
- Author/Creator:
- Roenker, K. P., author.
- Series:
- NBSIR ; 84-2822.
- NBSIR ; 84-2822
- Language:
- English
- Genre:
- Technical reports.
- Physical Description:
- 1 online resource.
- Place of Publication:
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1984.
- System Details:
- text file
- Notes:
- 1984.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Includes bibliographical references.
- OCLC:
- 945071249
- Publisher Number:
- GOVPUB-C13-c5167dc64271060a96cd395a10573a95
- Access Restriction:
- Open Access Unrestricted online access
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