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Workshop summary report : scanning probe nanolithography workshop / John A. Dagata, Hiroshi Yokoyama, Francesc Perez-Murano.

National Institute of Standards and Technology (NIST) Publications Available online

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Format:
Book
Government document
Contributor:
Dagata, John A.
Perez-Murano, Francesc.
Yokoyama, Hiroshi.
Manufacturing Engineering Laboratory (U.S.)
Series:
NISTIR ; 7040.
NISTIR ; 7040
Language:
English
Subjects (All):
Nanoelectronics.
Physical Description:
1 online resource (86 pages) : illustrations.
Place of Publication:
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2003].
System Details:
text file
Notes:
"January 2003."
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from page [1], viewed April 6, 2007.
Includes bibliographical references.
OCLC:
124074935
Publisher Number:
GOVPUB-C13-2a595f0c484316cf83fd83c867fe2926
Access Restriction:
Open Access Unrestricted online access

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