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Standard reference materials : certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry / Brian G. Rennex.
- Format:
- Book
- Government document
- Author/Creator:
- Rennex, Brian G, author.
- Series:
- NIST special publication ; 260-121.
- NIST special publication ; 260-121
- Language:
- English
- Genre:
- Technical reports.
- Physical Description:
- 1 online resource.
- Place of Publication:
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994.
- System Details:
- text file
- Notes:
- 1994.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Includes bibliographical references.
- OCLC:
- 926748665
- Publisher Number:
- GOVPUB-C13-e38651e9eb4e18ac5cc1a793902c1aff
- Access Restriction:
- Open Access Unrestricted online access
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